Publications
A compact flat-crystal X-ray spectrometer for external beam PIXE measurements A wavelength dispersive system based on a flat crystal coupled to a CCD
position-sensitive detector is described. The system, to be used in conjuction with an
external beam facility for PIXE measurements, is particularly compact, easy to use and has
a useful energy range extending from about 4 to 13 keV. The performance of the system with
respect to efficiency and energy resolution is studied as a function of different experimental
conditions. Possible simple applications are briefly discussed.
P. Tesauro, P.A. Mandò, G. Parrini, A. Pecchioli, P. Sona
Dipartimento di Fisica dell'Università e I.N.F.N. Firenze, Italy
Abstract